![Solutions for NanoAnalysis artwork](https://is4-ssl.mzstatic.com/image/thumb/Podcasts125/v4/3d/26/61/3d266100-208e-3d44-1ab5-56688cf15d2f/mza_12554284718271692223.jpg/100x100bb.jpg)
Avoiding Sample Collisions in your SEM
Solutions for NanoAnalysis
English - September 01, 2022 11:00 - 21 minutes - 30.2 MB - ★★★★★ - 1 ratingScience Education science nanoanalytics nanoanalysis Download Apple Podcasts Google Podcasts Overcast Castro Pocket Casts RSS feed
Next Episode: Handheld XRF and Fashion Fraud
Join us as we speak to Jack Mershon, Applications Specialist for Tescan USA Inc., about SEM advancements and the TESCAN Essence™ 3D Collision Model.
YouTube:
Bruker Detectors https://youtu.be/4iHCLUG7RGw
Website:
Bruker Detectors https://www.bruker.com/en/products-and-solutions/elemental-analyzers/eds-wds-ebsd-SEM-Micro-XRF.html
Essence™ 3D Collision Model – Tescan https://www.tescan.com/product/sem-for-materials-science-tescan-vega/
App Notes application notes:
Essence™ 3D Collision Model – Tescan flyer https://mbna.bruker.com/acton/attachment/15240/f-151ee2e2-f12c-4aa7-9864-7bb93c3f36b8/1/-/-/-/-/Tescan%20-%20Essence%203D%20collision%20model.pdf
Contact Us:
+1 800-234-XRAY(9729)